VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
ISBN-13: 9780123705976
ISBN-10: 0123705975
Authors: Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing
Edition: 1
Binding: Hardcover
Publisher: Morgan Kaufmann
Published: 2006-07-21
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